Our Laboratory for Mechanics of Materials and Nanostructures is looking for a
You will work on a three year research project funded by the Commission of Technology and Innovation (CTI) to develop and scientifically explore a new type of TOFSIMS instrument coupled to a commercial FIB-SEM instrument. The project is in close collaboration with a former start-up company developing and commercializing time-of-flight mass spectrometers.
You will explore the instrument sensitivity and develop methods to enhance the ionization probability by co-deposition of reactive species onto the analyzed surface. In addition you will explore new applications of the FIB-TOFSIMS in the frame of a large number of already running materials science research projects dealing with metal alloys, semiconductor samples, thin film developments and samples from life science. You will further be involved in correlative microscopy techniques in conjunction with other analytical techniques available in the scanning electron microscope (SEM). You will also support technical developments related to detector and ion optics design.
You must hold a PhD in Chemistry, Physics, Materials Science or similar. A high motivation to work at the leading edge of measurement science and to work in international and multidisciplinary research teams is essential. Knowledge of English (oral and written) is important and knowledge of German would be an advantage. Experience in both FIB or SEM based techniques and mass spectrometry is desirable.
The position is immediately available with initial contract duration of 1 year with the possibility for extension up to 3 years.
For more information please contact Dr. Johann Michler, firstname.lastname@example.org.
We are looking forward to receiving your application.